发明名称 SPECIMEN PROCESSING APPARATUS AND SPECIMEN PROCESSING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a specimen processing apparatus which can highly accurately and efficiently detect a state of specimens, and a specimen processing method. <P>SOLUTION: A specimen detector 10 comprises: a detection part 50 for processing a test tube 25 or a specimen 25a housed in the test tube 25; and a label peeling part 40 for peeling off at least part of a label 27 attached to a side part of the test tube 25 prior to processing. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012132939(A) 申请公布日期 2012.07.12
申请号 JP20120088207 申请日期 2012.04.09
申请人 AOI SEIKI KK 发明人 ITO TERUAKI
分类号 G01N35/02 主分类号 G01N35/02
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