发明名称 CIRCUIT BOARD INSPECTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To allow a separation distance between respective movable arms to extend more when measurement by a four-terminal pair method is performed with an X-Y type circuit board inspection device. <P>SOLUTION: Coaxial cables C1-C4 are used for electric wiring to a measurement part 20 of electric current probes P1, P2 and electric voltage probes P3, P4. A probe support part 32a of one movable arm 32 is caused to support a first electric current probe P1 and a first electric voltage probe P3, and a probe support part 31a of the other movable arm 31 is caused to support a second electric current probe P2 and a second electric voltage probe P4. For example, a cable support substrate 33 disposed over the probe support parts 31a, 32a is provided on the movable arm 32 side. One end sides of respective coaxial cables C are fixed to the cable support substrate 33 by connecting external conductors S thereof with predetermined conduction means, and internal conductors IL of the respective coaxial cables C are connected to corresponding probes P via deformable electrical relay means 50. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012132738(A) 申请公布日期 2012.07.12
申请号 JP20100284041 申请日期 2010.12.21
申请人 HIOKI EE CORP 发明人 SHIOIRI AKIHIRO
分类号 G01R31/02;G01R1/067;G01R27/02;H05K3/00 主分类号 G01R31/02
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