发明名称 |
APPARATUS AND METHOD FOR QUANTIFYING RESIDUAL STRESS OF A BIREFRINGENT MATERIAL |
摘要 |
An apparatus for quantifying residual stress of a birefringent material comprises a light source generating light; a vertical polarizer converting a beam of light into a beam with vertical polarization; a standard material being mounted in front of the vertical polarizer; a horizontal polarizer converting a beam of light into a beam with horizontal polarization; an applied force unit applying different forces to the standard material; a spectrometer being mounted in front of the horizontal polarizer and recording intensity of light passing through the horizontal polarizer and transmittance of the standard material and a processing module being connected to the spectrometer, deriving a stress formula from the applied forces and transmittances of the standard material and obtaining a stress distribution of the birefringent material. A method for quantifying residual stress of a birefringent material is also disclosed.
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申请公布号 |
US2012176598(A1) |
申请公布日期 |
2012.07.12 |
申请号 |
US201113158434 |
申请日期 |
2011.06.12 |
申请人 |
WANG WEI-CHUNG;HUANG CHI-HUNG;TSENG YU-CHENG;SUNG PO-CHI;NATIONAL TSING HUA UNIVERSITY |
发明人 |
WANG WEI-CHUNG;HUANG CHI-HUNG;TSENG YU-CHENG;SUNG PO-CHI |
分类号 |
G01B11/16 |
主分类号 |
G01B11/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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