发明名称 STACKED STRUCTURE OF NITRIDE SEMICONDUCTOR AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a stacked structure of a nitride semiconductor capable of reducing the amount of warpage and to provide a method of manufacturing the same. <P>SOLUTION: A stacked structure of a nitride semiconductor comprises a substrate having projections on its primary surface, a single-crystal layer that is directly provided on the primary surface of the substrate and covers the projections, and a nitride semiconductor layer provided on the single-crystal layer. The substrate does not contain a nitride semiconductor. The single-crystal layer includes cracks. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012134294(A) 申请公布日期 2012.07.12
申请号 JP20100284523 申请日期 2010.12.21
申请人 TOSHIBA CORP 发明人 SUGAWARA HIDETO;ONOMURA MASAAKI
分类号 H01L21/205;H01L33/32 主分类号 H01L21/205
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