发明名称 SAMPLING
摘要 Integrated circuitry, comprising: a sampling terminal for connecting the integrated circuitry to an external capacitance; sampling means operatively connected to the terminal to take samples, each sample having a sample value; and control means configured, whilst said external capacitance is connected to the sampling terminal, to: internally connect the sampling terminal, or another terminal of the integrated circuitry to which the external capacitance is also connected, to a given voltage-potential source to effect a change in charge stored on the external capacitance, the given voltage-potential source being available within the integrated circuitry when it is in use; cause the sampling means to take a plurality of samples over a period whilst that external capacitance charges or discharges following and/or during said change in charge; and judge whether an event has occurred in dependence upon the plurality of samples.
申请公布号 US2012176179(A1) 申请公布日期 2012.07.12
申请号 US201113312668 申请日期 2011.12.06
申请人 FUJITSU SEMICONDUCTOR LIMITED 发明人 HARDERS CHRISTIAN;FRONAUER WOLF;CHENG SHAOYUN;VOGEL MARKUS;FISCHER DIRK
分类号 H03K17/96;G01N27/22 主分类号 H03K17/96
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