发明名称 MANUFACTURING METHOD FOR SOI WAFER
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing an SOI wafer with a desired SOI layer thickness by performing epitaxial growth without causing step in a ravine form on an SOI wafer with no silicon oxide film in a terrace manufactured by an ion implantation separation method. <P>SOLUTION: A manufacturing method for an SOI wafer comprises: removing a periphery part of an implantation oxide film so that an outer peripheral end of an SOI layer of an SOI wafer is located outside an outer peripheral end of the implantation oxide film; heating the SOI wafer in a reductive atmosphere including hydrogen or an atmosphere including hydrogen chloride gas; and forming an epitaxial layer on a surface of the SOI layer. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012134242(A) 申请公布日期 2012.07.12
申请号 JP20100283574 申请日期 2010.12.20
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 AGA KOJI;YOKOGAWA ISAO;OKA TETSUSHI
分类号 H01L27/12;H01L21/02;H01L21/20 主分类号 H01L27/12
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