| 摘要 |
<p>This probe pin-socket assembly, which is intended to provide a novel means for improving the durability of probe pins with a short total length, is provided with a second impelling member for impelling a probe pin barrel in such a manner that the probe pin barrel is separated from a measurement substrate when a load is added to an electrode contact part of the probe pin barrel with the assembly being held on the measurement substrate. The second impelling member enables the contact pressure between the electrode contact part of the probe pin and a measurement electrode to be increased.</p> |
