发明名称 X-RAY ANALYZER AND X-RAY ANALYSIS METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide an X-ray analyzer and an X-ray analysis method appropriate for performing X-ray analysis. <P>SOLUTION: An X-ray analyzer includes a mask 18 formed with an aperture 36 for irradiation X-ray and a hole 38 for reference X-ray, a support part 19 for supporting a specimen 20, and a two-dimensional X-ray detector 22 for acquiring a hologram image obtained by irradiating the specimen with X-ray through the mask, and the mask and the support part are freely movable relative to each other. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012132756(A) 申请公布日期 2012.07.12
申请号 JP20100284290 申请日期 2010.12.21
申请人 FUJITSU LTD 发明人 NOMURA KENJI
分类号 G01N23/04 主分类号 G01N23/04
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