| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspection contact probe which surely contacts with a solder ball and can secure a certain amount of a contact area even in the case of a positioning error between the solder ball and the contact probe. <P>SOLUTION: In an inspection contact probe, a plurality of cones having acute-angled apexes inside a surface contacting with a terminal of an element to be inspected are formed. A surface connecting the apexes of the cones may be formed into a concave, and it is preferable that the number of the cones is equal to or more than nine and an apex angle of the cones is equal to or less than 60 degrees. <P>COPYRIGHT: (C)2012,JPO&INPIT |
