TEST TRAY FOR TESTING LIGHT-EMITTING DIODES

摘要

The present invention relates to a test tray for testing light-emitting diodes (hereinafter, referred to as "LEDs"), which enables a plurality of LEDs to be mounted simultaneously in the test tray and tested while moving between processes in a final process that automatically tests the performance of LEDs produced in a manufacturing process. A plurality of produced LEDs (approximately 60 to 240 LEDs) are placed into a main body of the test tray such that the lenses of the LEDs are exposed downwardly via respective through-holes communicating with respective insertion spaces, and an optical test is accurately performed while safely protecting the lenses when transferring the LEDs between processes. To this end, a plurality of insertion spaces (18) for accommodating LEDs (1) are formed in the upper surface of a main body (17) of a test tray (16) for testing LEDs (1), and through-holes (19) communicating with the bottom of the main body (17) are formed in the bottoms of the respective insertion spaces (18) such that a test on LEDs (1) can be performed with the lenses (L) of the LEDs (1) accommodated in the respective insertion spaces (18) being exposed downwardly via the through-holes (19).