发明名称 CLEANING LIQUID FOR CMP POLISHING LIQUID, CLEANING METHOD USING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a cleaning liquid for a CMP polishing liquid which suppresses deterioration of a polishing speed and can suppress the occurrence of a polishing scratch, and to provide a cleaning process using the same and a method for manufacturing a semiconductor substrate using the same. <P>SOLUTION: In the cleaning liquid for the CMP polishing liquid which cleans the feeding device of a CMP polishing liquid and contains a strong acid, the strong acid included in the cleaning liquid for the CMP polishing liquid is at least one compound selected from sulfuric acid, oxalic acid, hypochlorous acid, hydrofluoric acid, nitric acid and hydrochloric acid. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012134357(A) 申请公布日期 2012.07.12
申请号 JP20100285803 申请日期 2010.12.22
申请人 HITACHI CHEM CO LTD 发明人 YOSHIKAWA SHIGERU;OTA MUNEHIRO
分类号 H01L21/304;B08B3/08 主分类号 H01L21/304
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