发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method with less variation in sheet resistance, which can shorten a period of a manufacturing process. <P>SOLUTION: In a semiconductor device manufacturing method of forming a resistance element by injecting an impurity ion into a semiconductor region on which semiconductor layers are layered, when a second semiconductor layer 5 is layered on a first semiconductor layer 4 and the resistance element composed of the first semiconductor layer is formed, an amount of the impurity ion reaching into the first semiconductor layer is controlled by changing a thickness of the second semiconductor layer. As a result, the resistance element having preset sheet resistance is formed. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012134195(A) 申请公布日期 2012.07.12
申请号 JP20100282513 申请日期 2010.12.20
申请人 NEW JAPAN RADIO CO LTD 发明人 MIYAKOSHI KAORU
分类号 H01L21/822;H01L27/04 主分类号 H01L21/822
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