发明名称 PRESSURE CONTROLLED POLISHING PLATEN
摘要 A method and apparatus for controlling pressure or forces applied to a substrate in a polishing process is described. In one embodiment, a polishing system is described. The system includes a platen rotatably disposed on a base, the platen having a sidewall and a polishing pad disposed thereon forming an interior volume, and a pad pressure applicator disposed in the interior volume of the platen adjacent the underside of the polishing pad.
申请公布号 WO2012094102(A2) 申请公布日期 2012.07.12
申请号 WO2011US64396 申请日期 2011.12.12
申请人 APPLIED MATERIALS, INC.;CHEN, HUNG CHIH 发明人 CHEN, HUNG CHIH
分类号 H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址