发明名称 TECHNIQUE AND APPARATUS FOR MONITORING ION MASS, ENERGY, AND ANGLE IN PROCESSING SYSTEMS
摘要 A time-of-flight (TOF) ion sensor system for monitoring an angular distribution of ion species having an ion energy and incident on a substrate includes a drift tube wherein the ion sensor system is configured to vary an angle of the drift tube with respect to a plane of the substrate. The drift tube may have a first end configured to receive a pulse of ions from the ion species wherein heavier ions and lighter ions of the pulse of ions arrive in packets at a second end of the drift tube. An ion detector may be disposed at the second end of the ion sensor, wherein the ion detector is configured to detect the packets of ions derived from the pulse of ions and corresponding to respective different ion masses.
申请公布号 US2012175518(A1) 申请公布日期 2012.07.12
申请号 US20110987950 申请日期 2011.01.10
申请人 GODET LUDOVIC;LEAVITT CHRISTOPHER J.;KOO BON-WOONG;RENAU ANTHONY;VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC. 发明人 GODET LUDOVIC;LEAVITT CHRISTOPHER J.;KOO BON-WOONG;RENAU ANTHONY
分类号 H01J49/00 主分类号 H01J49/00
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