发明名称 CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING DETECTED SIGNAL THEREOF
摘要 <p>This charged particle beam device is provided with: a signal processing function for acquiring a secondary signal obtained when a charged particle beam is scanned at a speed slow enough to be unlimited by a band limitation of an electrical signal path and a secondary signal obtained when a charged particle beam is scanned at a high speed which is limited by the band limitation of the electrical signal path, calculating a degradation function (H-1(s)) between the plurality of secondary signals, and setting an inverse function of the degradation function as a compensation filter; and a function for updating a parameter of the compensation filter to an optimal value as needed or at an arbitrary timing. These functions enable optimal image restoration in the charged particle radiation device even when a detector or an amplifier circuit constituting the electrical signal path deteriorates with age.</p>
申请公布号 WO2012093593(A1) 申请公布日期 2012.07.12
申请号 WO2011JP79765 申请日期 2011.12.22
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION;KAMIO MASATO;WATANABE MASASHI;HOSHINO YOSHINOBU;KAWAMATA SHIGERU 发明人 KAMIO MASATO;WATANABE MASASHI;HOSHINO YOSHINOBU;KAWAMATA SHIGERU
分类号 H01J37/244;H01J37/22;H01J37/28 主分类号 H01J37/244
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