发明名称 Method and device for imaging an object using a scanning microscope
摘要 The method comprises scanning object points by a scanning beam (14) in successive sampling time intervals, capturing an intensity of a radiation emitted by the respective scanned object point within the sampling time, determining an intensity average value from the intensities as average value-pixel signal recorded into the respective sampled object point, determining an intensity variable value as variable-pixel signal from the intensities recorded into the respective sampled object point, and assembling the average value-pixel signals to an average value-raster display signal. The method comprises scanning object points by a scanning beam (14) in successive sampling time intervals, capturing an intensity of a radiation emitted by the respective scanned object point within the sampling time, determining an intensity average value from the intensities as average value-pixel signal recorded into the respective sampled object point, determining an intensity variable value as variable-pixel signal from the intensities recorded into the respective sampled object point, assembling the average value-pixel signals to an average value-raster display signal, assembling the variable-pixel signals to a variable-raster image signal, generating an evaluation-pixel signal based on the respective average value-pixel signal and an associated variable-pixel signal, and assembling the generated evaluation-pixel signals to an evaluation-raster image signal. The intensity of the emitted radiation is digitized within the respective sampling time for detecting intensity values in successive sub-intervals of n times, where n is an integer greater than 1 and the sub-intervals are respectively equal to 1/n-fold of the sampling time interval. The intensity values are detected in which one of the emitted radiations is converted into the respective intensity value representing a digital signal corresponding to an analog signal by an analog-digital converter within the respective sampling time interval of n times with a predetermined relaying, which is equal to the sub-interval. The intensity values are detected in which a number of photons is determined, where the photons correspond to the emitted radiation by a photon counter within the respective sampling time interval of n times with the predetermined number of time, which is equal to the sub-interval. The respective intensity values are given in the specification. Independent claims are included for: (1) a device for scanning microscopic image of an object; and (2) a confocal scanning microscope.
申请公布号 EP2474852(A1) 申请公布日期 2012.07.11
申请号 EP20120150790 申请日期 2012.01.11
申请人 LEICA MICROSYSTEMS CMS GMBH 发明人 BIRK, HOLGER;WIDZGOWSKI, BERND;NISSLE, HOLGER
分类号 G02B21/00;G01N21/64 主分类号 G02B21/00
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