发明名称 |
SUBSTRATE PROCESSING METHOD FOR PHOTOLITHOGRAPHY PROCESS |
摘要 |
PURPOSE: A substrate processing method for a photolithographic process is provided to efficiently manage the continuous processing of substrates by minimizing environmental temperature set-up time for a bake. CONSTITUTION: Bake temperature is identified through a process recipe of preceding substrates and following substrates. The temperature of a bake module(220) is set for each preceding substrates and following substrates if the bake temperature of the preceding substrates and the following substrates is different. Bake modules are divided into a bake module(220a) in a first group baking the preceding substrates and a bake module(220b) in a second group baking the following substrates and set to be the bake temperature of each corresponding process recipe in a temperature set-up step.
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申请公布号 |
KR20120077880(A) |
申请公布日期 |
2012.07.10 |
申请号 |
KR20100139997 |
申请日期 |
2010.12.31 |
申请人 |
SEMES CO., LTD. |
发明人 |
KANG, DONG YEON;GO, JAE SEUNG |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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