发明名称 Methods for fabricating semiconductor devices having local contacts
摘要 Fabrication methods for semiconductor device structures are provided. One method for fabricating a semiconductor device structure that includes a gate structure overlying a semiconductor substrate and a doped region formed in the semiconductor substrate adjacent to the gate structure involves the steps of forming a first layer of dielectric material overlying the gate structure and the doped region, isotropically etching the first layer of dielectric material, forming a second layer of dielectric material overlying the first layer of dielectric material after isotropically etching the first layer, and forming a conductive contact that is electrically connected to the doped region within the first layer and the second layer.
申请公布号 US8216928(B1) 申请公布日期 2012.07.10
申请号 US201113014561 申请日期 2011.01.26
申请人 RICHTER RALF;HUISINGA TORSTEN;HEINRICH JENS;GLOBALFOUNDRIES, INC. 发明人 RICHTER RALF;HUISINGA TORSTEN;HEINRICH JENS
分类号 H01L21/44 主分类号 H01L21/44
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