发明名称 METHOD FOR TESTING AN ORGANIC LIGHT EMITTING DIODE PANEL
摘要 PURPOSE: An inspection method of an organic light emitting diode panel is provided to monitor the quality of an OLED(Organic Light Emitting Diode) panel in real time by inspecting an organic light emitting diode panel by using a noise measuring method. CONSTITUTION: Substrate preprocessing is performed through a substrate preprocessing unit(302). A prepared substrate is put into a deposition unit and a deposition process is performed(304). An OLED(Organic Light Emitting Diode) panel of an OLED display device is completed after an encapsulation process in an encapsulation unit(306). An inspection process is performed in the OLED panel through an inspection unit(308).
申请公布号 KR20120077791(A) 申请公布日期 2012.07.10
申请号 KR20100139876 申请日期 2010.12.31
申请人 LG DISPLAY CO., LTD.;KOREA UNIVERSITY RESEARCH AND BUSINESS FOUNDATION 发明人 PARK, SUNG HEE;KIM, GYU TAE;JANG, DO YOUNG;KANG, PIL SOO
分类号 H01L51/56 主分类号 H01L51/56
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