| 摘要 |
PURPOSE: An image processing system with an on-chip test mode about a column ADC is provided to test performance of the column ADC without directly irradiating light onto a pixel array and applying an analog value from the outside. CONSTITUTION: A pixel array includes a plurality of normal pixel columns and at least one test pixel column(210). A plurality of column ADC(Analog to Digital Converter)s(130M,130a) correspond to the normal pixel columns respectively. A switching unit(280M,280A) provides an output signal of a normal pixel column to an input terminal of a corresponding column ADC in a normal mode. The switching unit provides an output signal of the test pixel column to an input terminal of each column ADC in a test mode. |
