| 摘要 |
PURPOSE: A semiconductor device is provided to test a memory cell array with large capacity by using a test apparatus with a small buffer size. CONSTITUTION: A memory cell array(1) reads a plurality of data after writing the plurality of the data. A defect determining unit(2) generates a data determination signal by comparing the read data with the written data. A signal transmitting unit(3) transmits a data determination signal to the outside in response to a test signal. |
