| 摘要 |
<P>PROBLEM TO BE SOLVED: To cut off power supply to a device to be tested at a high speed even at the time of abnormal test. <P>SOLUTION: The test device tests the device to be tested. This test device is provided which includes: a power supply unit which generates a power supply voltage to be supplied to the device to be tested; an inductive load unit provided on a path between the power supply unit and the device to be tested; a plurality of semiconductor switches serially-connected onto the path between the inductive load unit and the device to be tested; and a control unit which turns off the plurality of the semiconductor switches when the supply of voltage to the device to be tested is cut off. <P>COPYRIGHT: (C)2012,JPO&INPIT |
