发明名称 TEST DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To detect whether or not energy accumulated in an inductive load part is discharged. <P>SOLUTION: A test device tests a device to be tested. This test device is provided which includes: a power supply part which generates a power supply voltage to be supplied to the device to be tested; an inductive load part provided on a path between the power supply part and the device to be tested; a storage part in which a substrate including at least the inductive load part is stored; and a lock maintaining part which maintains a locked state of an opening/closing part for allowing an operator to access to the substrate in the storage part when the voltage at a predetermined point on the substrate is higher than the set voltage. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012127809(A) 申请公布日期 2012.07.05
申请号 JP20100279625 申请日期 2010.12.15
申请人 ADVANTEST CORP 发明人 HASHIMOTO KENJI
分类号 G01R31/28 主分类号 G01R31/28
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