AN INTEGRATED CIRCUIT TESTING SMART CARD AND A DRIVING METHOD THEREOF

摘要

PURPOSE: An integrated circuit and a driving method thereof are provided to scan and test a specific block which does not controlled by a central processing unit within a smart card without adding a separate pad. CONSTITUTION: A target logic circuit(6) responses the control of a scan controller(4) and receives a scan input pattern. The target logic circuit executes an operation according to the scan input pattern and outputs an execution result. The scan controller outputs a comparison result of the execution result and an output pattern. An input-output blocker blocks input and output of the target logic circuit while the target logic circuit is tested by using the scan input pattern. A central processing unit controls the input-output blocker and the scan controller.