发明名称 METHOD TO REDUCE DEPTH DELTA BETWEEN DENSE AND WIDE FEATURES IN DUAL DAMASCENE STRUCTURES
摘要 A method of forming a device is disclosed. The method includes providing a substrate prepared with a dielectric layer having first and second regions. The first region comprises wide features and the second region comprises narrow features. A depth delta exists between bottoms of the wide and narrow features. A non-conformal layer is formed on the substrate and it lines the wide and narrow trenches in the first and second regions. The non-conformal layer is removed. Removing the non-conformal layer reduces the depth delta between the bottoms of the wide and narrow features in the first and second region.
申请公布号 US2012168957(A1) 申请公布日期 2012.07.05
申请号 US20100981519 申请日期 2010.12.30
申请人 SRIVASTAVA RAVI PRAKASH;OGUNSOLA OLUWAFEMI O.;CHILD CRAIG;PALLACHALIL MUHAMMED SHAFI KURIKKA VALAPPIL;HICHRI HABIB;ANGYAL MATTHEW;MIYAJIMA HIDESHI;GLOBALFOUNDRIES SINGAPORE PTE. LTD.;INTERNATIONAL BUSINESS MACHINES CORPORATION;TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.;INFINEON TECHNOLOGIES NORTH AMERICA CORP.;ADVANCED MICRO DEVICES CORPORATION 发明人 SRIVASTAVA RAVI PRAKASH;OGUNSOLA OLUWAFEMI O.;CHILD CRAIG;PALLACHALIL MUHAMMED SHAFI KURIKKA VALAPPIL;HICHRI HABIB;ANGYAL MATTHEW;MIYAJIMA HIDESHI
分类号 H01L23/48;H01L21/28;H01L21/31 主分类号 H01L23/48
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