| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor testing device capable of shortening time required for a gradation test of a device to be tested by shortening time for quality determination based on a differential value between positive output and negative output. <P>SOLUTION: According to a representative structure of the present invention, a semiconductor testing device 100 for performing a gradation test of an FPD driver 102 includes A/D converters 112a to 112n adapted to perform A/D conversion of positive output or negative output outputted from a pin of the FPD driver 102, a memory 118 adapted to store one of the A/D converted positive output and negative output, and a differential arithmetic circuit 114 adapted to sequentially calculate a differential value between positive output and negative output regarding the same pin, from which the one of the A/D converted positive output and negative output stored in the memory 118 is outputted, by receiving input of the other one of the A/D converted positive output and negative output. <P>COPYRIGHT: (C)2012,JPO&INPIT |
