发明名称 HALF-TONE MASK, HALF-TONE MASK BLANK, AND METHOD FOR PRODUCING HALF-TONE MASK
摘要 [Problem] To provide a half-tone mask wherein side etching of an etching stopper layer can be suppressed in a cleaning process that uses concentrated sulfuric acid. [Solution] The half-tone mask is provided with a transmissive part (TA), a semi-transmissive part (HA) and a light-blocking part (PA). The light-blocking part (PA) comprises a substrate (S), a semi-transmissive layer (11), a light-blocking layer (13) that is arranged on the semi-transmissive layer and formed of Cr or a Cr compound, and an etching stopper layer (12) that is arranged between the semi-transmissive layer (11) and the light-blocking layer (13). The etching stopper layer (12) contains a first element and a second element. The first element is composed of at least one element selected from the group consisting of Mo and W and has a compositional ratio of 6.4-38.2 mol% (inclusive). The second element is composed of at least one element selected from the group consisting of Zr, Nb, Hf and Ta.
申请公布号 WO2012090439(A1) 申请公布日期 2012.07.05
申请号 WO2011JP07154 申请日期 2011.12.21
申请人 ULVAC COATING CORPORATION;NAKAMURA, DAISUKE;KAGEYAMA, KAGEHIRO 发明人 NAKAMURA, DAISUKE;KAGEYAMA, KAGEHIRO
分类号 G03F1/32 主分类号 G03F1/32
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