发明名称 |
HALF-TONE MASK, HALF-TONE MASK BLANK, AND METHOD FOR PRODUCING HALF-TONE MASK |
摘要 |
[Problem] To provide a half-tone mask wherein side etching of an etching stopper layer can be suppressed in a cleaning process that uses concentrated sulfuric acid. [Solution] The half-tone mask is provided with a transmissive part (TA), a semi-transmissive part (HA) and a light-blocking part (PA). The light-blocking part (PA) comprises a substrate (S), a semi-transmissive layer (11), a light-blocking layer (13) that is arranged on the semi-transmissive layer and formed of Cr or a Cr compound, and an etching stopper layer (12) that is arranged between the semi-transmissive layer (11) and the light-blocking layer (13). The etching stopper layer (12) contains a first element and a second element. The first element is composed of at least one element selected from the group consisting of Mo and W and has a compositional ratio of 6.4-38.2 mol% (inclusive). The second element is composed of at least one element selected from the group consisting of Zr, Nb, Hf and Ta. |
申请公布号 |
WO2012090439(A1) |
申请公布日期 |
2012.07.05 |
申请号 |
WO2011JP07154 |
申请日期 |
2011.12.21 |
申请人 |
ULVAC COATING CORPORATION;NAKAMURA, DAISUKE;KAGEYAMA, KAGEHIRO |
发明人 |
NAKAMURA, DAISUKE;KAGEYAMA, KAGEHIRO |
分类号 |
G03F1/32 |
主分类号 |
G03F1/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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