| 摘要 |
<P>PROBLEM TO BE SOLVED: To easily determine abnormalities or deterioration of apparatuses or the like constituting a plant. <P>SOLUTION: An abnormality detecting device performs the following steps of: defining two data, which are assumed to have a cause and effect relationship with each other, of time series data obtained by sequentially observing apparatuses or the like constituting a plant with a lapse of time as input data and output data; extracting information associated with response characteristics of the output data with respect to the input data for each kind of variations, such as an increasing tendency, a decreasing tendency, a steady tendency, a vibrating tendency or the like of the input data, of data specific to a controlling system; and detecting a candidate for abnormal data based on a deviation of the information associated with the response characteristics. <P>COPYRIGHT: (C)2012,JPO&INPIT |
