发明名称 CMP SLURRY COMPOSITION FOR SELECTIVELY POLISHING A SILICON NITRIDE LAYER, AND METHOD FOR POLISHING A SILICON NITRIDE LAYER USING SAME
摘要 The present invention relates to a CMP slurry composition for selectively polishing a silicon nitride layer, and to a method for polishing a silicon nitride layer using same. More particularly, the present invention relates to a CMP slurry composition for selectively polishing a silicon nitride layer, which can selectively polish a silicon nitride layer by means of comprising both a (meth)acrylate copolymer and a pyrimidine compound to increase the polishing speed of a silicon nitride layer relative to a silicon oxide layer and/or polysilicon. The invention also relates to a method for polishing a silicon nitride layer using the CMP slurry composition.
申请公布号 WO2012091330(A2) 申请公布日期 2012.07.05
申请号 WO2011KR09664 申请日期 2011.12.15
申请人 CHEIL INDUSTRIES INC.;LIM, GEON JA;CHUN, JONG SUN;KIM, KEE WOOK;HONG, CHANG KI 发明人 LIM, GEON JA;CHUN, JONG SUN;KIM, KEE WOOK;HONG, CHANG KI
分类号 C09K3/14;H01L21/304 主分类号 C09K3/14
代理机构 代理人
主权项
地址