发明名称 HEAT DISSIPATION STRUCTURE OF CHIP
摘要 A heat dissipation structure of a chip in the field of microelectronics is provided. The heat dissipation structure includes a P-type superlattice layer and an N-type superlattice layer formed over an upper surface of the chip by oxidation isolation. The P-type superlattice and the N-type superlattice are isolated by silicon oxide. Through a contact hole the P-type superlattice is electrically connected to a metal layer that is applied with a low potential in the chip, and a metal layer to be connected with an external power source is formed over the P-type superlattice. Through a contact hole the N-type superlattice is electrically connected to a metal layer that is applied with a high-potential power source in the chip, and a metal layer to be connected with an external power source is formed over the N-type superlattice. The potential of the external power source connected with the P-type superlattice is lower than that of the external power source connected with the N-type superlattice. The present invention can achieve heat dissipation of the chip and meanwhile prevent the ambient heat from transferring into the chip, by using the feature that the superlattice has a low thermal conductivity and phonon-localization-like behavior.
申请公布号 US2012168770(A1) 申请公布日期 2012.07.05
申请号 US201113391270 申请日期 2011.11.18
申请人 HUANG RU;HUANG XIN;ZHANG TIANWEI;HUANG QIANQIAN;QIN SHIQIANG;PEKING UNIVERSITY 发明人 HUANG RU;HUANG XIN;ZHANG TIANWEI;HUANG QIANQIAN;QIN SHIQIANG
分类号 H01L29/20;H01L29/12 主分类号 H01L29/20
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