| 摘要 |
A socket contact for testing a semiconductor. The socket contact includes a first contact portion, a second contact portion, and first and second body portions connecting the first contact portion and the second contact portion, wherein each of the first and second body portions has a first end, a second end opposite to the first end, and a connecting portion between the first and second ends, the first end of the first body portion and the first end of the second body portion contact the first contact portion, the second end of the first body portion and the second end of the second body portion contact the second contact portion, and the connecting portion of the first body portion and the connecting portion of the second body portion are spaced apart from each other.
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