发明名称 SWITCH DEVICE AND TEST APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor switch device with a large input voltage range. <P>SOLUTION: The semiconductor switch device, electrically turning on and off between a first and a second terminals according to a control voltage to be input from the outside, comprises: a main switch that has a source and a drain connected between the first and the second terminals and are turned on or off according to a difference between an input voltage to be input into the switch device and a gate voltage; and a control section that supplies, to the gate of the main switch, a driving voltage obtained by voltage-shifting a first reference voltage according to a control voltage and an input voltage. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012129939(A) 申请公布日期 2012.07.05
申请号 JP20100281974 申请日期 2010.12.17
申请人 ADVANTEST CORP 发明人 HATA YOSHIYUKI;NAKANISHI SHIN;TAKIGAWA MASAHIKO
分类号 H03K19/0185;G01R31/28;H03K17/687 主分类号 H03K19/0185
代理机构 代理人
主权项
地址