发明名称 SCAN CELL DESIGNS WITH SERIAL AND PARALLEL LOADING OF TEST DATA
摘要 A scan cell is configured to receive first, second and third data bits at respective first, second and third data inputs. A control input is configured to receive a control signal. Latching logic is configured to latch data received at the first and second latch inputs to a scan cell output. The first latch input is configured to receive the first data bit. Selection logic is configured to select between the second and third data bits depending on a state of the control signal, and to provide the selected bit to the second latch input.
申请公布号 US2012173939(A1) 申请公布日期 2012.07.05
申请号 US20100982642 申请日期 2010.12.30
申请人 CHAKRAVARTY SREEJIT 发明人 CHAKRAVARTY SREEJIT
分类号 G01R31/3177;G06F11/25 主分类号 G01R31/3177
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