| 摘要 |
In a method of compensating the center position of a mechanical arm which has a first probe, a second probe, and a platform, a first test point and a second test point are selected on an electronic product and coordinates of the two points are acquired. A distance R between the first probe and the mechanical arm is received, and an angle &thetas; between the platform and a line formed according to the two points is computed to obtain compensated coordinates of the mechanical arm. The mechanical arm moves to the location of the compensated coordinates, and thus locating the first probe and the second probe respectively at the first test point and the second test point. |
