发明名称 Method for measuring shape of thick multi-planar reformatted (MPR) digital image, involves calculating desired measurement value from accumulated samples, after connecting rays from starting to terminal points
摘要 The method involves recognizing (11) the shape of an MPR digital image. The points of detected form on starting level of MPR disk are scanned (12) to obtain starting points for generating recognized shape. A terminal point in MPR disk is calculated (13) corresponding to each starting point. A ray is propagated (14) from each starting point to each appropriate terminal point. The samples along each ray are accumulated (15) and desired measurement value from accumulated samples is calculated (18), after attaining of rays at the terminal point. An independent claim is included for machine-readable program memory device for measuring shape of thick MPR digital image.
申请公布号 DE102011115236(A1) 申请公布日期 2012.07.05
申请号 DE201110115236 申请日期 2011.09.28
申请人 SIEMENS CORP. 发明人 YANG, LINING
分类号 G06T7/60;A61B5/055;A61B6/03;A61B19/00 主分类号 G06T7/60
代理机构 代理人
主权项
地址