发明名称 |
SEMICONDUCTOR DEVICES INCLUDING STRAINED SEMICONDUCTOR REGIONS AND METHODS OF FABRICATING THE SAME, AND AN ELECTRONIC SYSTEM INCLUDING THE SAME |
摘要 |
<p>PURPOSE: A semiconductor device including a strained semiconductor region, a manufacturing method thereof, and an electronic system including the same are provided to improve etch selectivity by applying a chemical dry etch method to an isotropic dry etch method. CONSTITUTION: A gate pattern(120) is formed on a substrate(110). An amorphous silicon region is formed by injecting IV or VIII group dopants into the substrate. A gate spacer(150) is formed in the sidewall of the gate pattern. A first cavity(160) is formed by firstly etching the substrate and the amorphous silicon region. A second cavity(162) is formed by secondly etching the substrate. A strained semiconductor region is formed in the second cavity.</p> |
申请公布号 |
KR20120073727(A) |
申请公布日期 |
2012.07.05 |
申请号 |
KR20100135572 |
申请日期 |
2010.12.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YOON, JUN HO;SHIN, KYOUNG SUB;LEE, JIN WOOK;HAN, JE WOO;KIM, HYUNG YONG |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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