发明名称 SEMICONDUCTOR DEVICES INCLUDING STRAINED SEMICONDUCTOR REGIONS AND METHODS OF FABRICATING THE SAME, AND AN ELECTRONIC SYSTEM INCLUDING THE SAME
摘要 <p>PURPOSE: A semiconductor device including a strained semiconductor region, a manufacturing method thereof, and an electronic system including the same are provided to improve etch selectivity by applying a chemical dry etch method to an isotropic dry etch method. CONSTITUTION: A gate pattern(120) is formed on a substrate(110). An amorphous silicon region is formed by injecting IV or VIII group dopants into the substrate. A gate spacer(150) is formed in the sidewall of the gate pattern. A first cavity(160) is formed by firstly etching the substrate and the amorphous silicon region. A second cavity(162) is formed by secondly etching the substrate. A strained semiconductor region is formed in the second cavity.</p>
申请公布号 KR20120073727(A) 申请公布日期 2012.07.05
申请号 KR20100135572 申请日期 2010.12.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOON, JUN HO;SHIN, KYOUNG SUB;LEE, JIN WOOK;HAN, JE WOO;KIM, HYUNG YONG
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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