发明名称 Microlithographic projection exposure system i.e. vacuum projection exposure system, operating method, involves changing bandwidth of projection light produced by light sources of system while exposing regions on photosensitive layer
摘要 <p>The method involves imaging a mask (14) on a photosensitive layer (22) for exposure of the mask. Bandwidth of projection light produced by light sources of a projection exposure system (10) is changed while exposing coherent regions on the photosensitive layer or between two exposures. The bandwidth is changed depending on an arrangement of imaging structures (18) in the mask. Spacing is formed between the photosensitive layer, and a projection lens (20) of the projection exposure system is changed during change of the bandwidth. An independent claim is also included for a microlithographic projection exposure system comprising light sources.</p>
申请公布号 DE102011080919(A1) 申请公布日期 2012.07.05
申请号 DE20111080919 申请日期 2011.08.12
申请人 CARL ZEISS SMT GMBH 发明人 PATRA, MICHAEL
分类号 G03F7/20 主分类号 G03F7/20
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