发明名称 SEMICONDUCTOR DRIVE DEVICE
摘要 When there is a short circuit failure between the gate and emitter of a main switching element such as an IGBT, the temperature of a turn-on gate resistor or turn-off gate resistor is detected by a thermistor, and a drive circuit is protected by turning off a turn-on gate drive switching element or a turn-off gate drive switching element. Furthermore, instead of detecting the temperature of the turn-on gate resistor or turn-off gate resistor, a thermistor is connected in series with the turn-on gate drive switching element or turn-off gate drive switching element, the resistance change corresponding to a change in temperature of the thermistor is detected, and the drive circuit is protected by turning off the turn-on gate drive switching element or turn-off gate drive switching element.
申请公布号 EP2472707(A1) 申请公布日期 2012.07.04
申请号 EP20100811642 申请日期 2010.07.28
申请人 FUJI ELECTRIC CO., LTD. 发明人 ABE, Yasushi
分类号 H02M1/00;H02M1/08;H03K17/08;H03K17/0812;H03K17/082;H03K17/56 主分类号 H02M1/00
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