发明名称 Forming isolation regions for integrated circuits
摘要 A substrate may have active areas at different levels separated by a mask. Along the mask may be a shallow trench isolation. Along the shallow trench isolation may be a LOCOS isolation. The shape of a substrate transition region between the levels may be tunably controlled. The shallow trench isolation may reduce the bird's beak effect.
申请公布号 US8211778(B2) 申请公布日期 2012.07.03
申请号 US20080342312 申请日期 2008.12.23
申请人 COLOMBO ROBERTO;PIAZZA LUCA DI;MICRON TECHNOLOGY, INC. 发明人 COLOMBO ROBERTO;PIAZZA LUCA DI
分类号 H01L21/76 主分类号 H01L21/76
代理机构 代理人
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