发明名称 Method for forming semiconductor structure
摘要 The invention provides a method for forming a semiconductor structure. A substrate is provided. A conductive layer is formed on the substrate. A first patterned mask layer is formed on the conductive layer. The conductive layer exposed by the first patterned mask layer is removed to expose a first sidewall of the conductive layer. A doped region is formed in the substrate by a doping step using the first patterned mask layer as a mask. The first patterned mask layer is removed. A second patterned mask layer is formed on the conductive layer. The conductive layer exposed by the second patterned mask layer is removed to expose a second sidewall opposite to the first sidewall of the conductive layer. The second patterned mask layer is removed.
申请公布号 US8211774(B2) 申请公布日期 2012.07.03
申请号 US20090562968 申请日期 2009.09.18
申请人 LO WEN-HSUN;LIU HSING-CHAO;CHERN JIN-DONG;HUANG PO-SHUN;VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION 发明人 LO WEN-HSUN;LIU HSING-CHAO;CHERN JIN-DONG;HUANG PO-SHUN
分类号 H01L21/336 主分类号 H01L21/336
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