发明名称 Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever
摘要 Provided is a cantilever that is capable of bending and deforming in an active manner by itself. The cantilever includes: a lever portion having a proximal end that is supported by a main body part; and a resistor member that is formed in the cantilever and generates heat when a voltage is applied, to thereby deform the lever portion by thermal expansion due to the heat.
申请公布号 US8214915(B2) 申请公布日期 2012.07.03
申请号 US20090455556 申请日期 2009.06.03
申请人 SHIGENO MASATSUGU;WATANABE KAZUTOSHI;IYOKI MASATO;WATANABE NAOYA;SII NANOTECHNOLOGY INC. 发明人 SHIGENO MASATSUGU;WATANABE KAZUTOSHI;IYOKI MASATO;WATANABE NAOYA
分类号 G01Q20/00;G01Q20/04;G01Q60/32;G01Q60/38 主分类号 G01Q20/00
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