发明名称 Device for analyzing size and location of conductive item
摘要 A matrix analyzer for determining the size and location of a conductive item placed thereon. The matrix analyzer includes plural row conductors and column conductors with a corresponding grid of conductive areas exposed on the surface of the matrix analyzer. When a conductive item, such as an ink droplet, is jetted onto the matrix analyzer, the intersection of various row conductors and column conductors exhibit a low resistance. The rows and columns of the matrix analyzer can be sequentially accessed to find those intersections where the low resistance exists. From such data, the size and location of the ink droplets can be determined.
申请公布号 US8212575(B2) 申请公布日期 2012.07.03
申请号 US20080344803 申请日期 2008.12.29
申请人 SHADWICK DAVID THOMAS;LEXMARK INTERNATIONAL, INC. 发明人 SHADWICK DAVID THOMAS
分类号 G01N27/04;B41J29/393;G01N15/02 主分类号 G01N27/04
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