发明名称 |
FORMING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a semiconductor device is provided to prevent characteristic deterioration of a single channel with a phosphorous ion and an injected diffusion barrier material. CONSTITUTION: A gate insulating layer(210), a gate(200), and a source/drain(300) are formed on a substrate. A phosphorous ion and a diffusion barrier material are inserted in the formed source/drain. The diffusion barrier material is injected by injecting at least one of a carbon ion or a carbon cluster material. A dose supplementary material is injected by injecting an arsenic ion.
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申请公布号 |
KR20120070296(A) |
申请公布日期 |
2012.06.29 |
申请号 |
KR20100131797 |
申请日期 |
2010.12.21 |
申请人 |
SK HYNIX INC. |
发明人 |
JOO, YUNG HWAN;JIN, SEUNG WOO;LEE, AN BAE;JANG, IL SIK;CHA, JAE CHUN |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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