发明名称 FORMING METHOD OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a semiconductor device is provided to prevent characteristic deterioration of a single channel with a phosphorous ion and an injected diffusion barrier material. CONSTITUTION: A gate insulating layer(210), a gate(200), and a source/drain(300) are formed on a substrate. A phosphorous ion and a diffusion barrier material are inserted in the formed source/drain. The diffusion barrier material is injected by injecting at least one of a carbon ion or a carbon cluster material. A dose supplementary material is injected by injecting an arsenic ion.
申请公布号 KR20120070296(A) 申请公布日期 2012.06.29
申请号 KR20100131797 申请日期 2010.12.21
申请人 SK HYNIX INC. 发明人 JOO, YUNG HWAN;JIN, SEUNG WOO;LEE, AN BAE;JANG, IL SIK;CHA, JAE CHUN
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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