发明名称 SIMULTANEOUS WAFER BONDING AND INTERCONNECT JOINING
摘要 PURPOSE: A method for simultaneously bonding and mutually connecting wafers is provided to minimize signal propagation delay by maintaining low impedance and a short distance. CONSTITUTION: A second element(200) comprises a main surface, a bond pad, and a dielectric layer(220). A thermal expansion coefficient of the second element is below 10 ppm/°C. The second element includes a plurality of active circuit elements. A first metal layer is arranged on the dielectric layer and the bond pad of a microelectronic element. A second metal layer(230) is arranged on the dielectric layer and the bond pad of the second element.
申请公布号 KR20120069515(A) 申请公布日期 2012.06.28
申请号 KR20110061826 申请日期 2011.06.24
申请人 TESSERA INC. 发明人 OGANESIAN VAGE;HABA BELGACEM;MOHAMMED ILYAS;SAVALIA PIYUSH;MITCHELL CRAIG
分类号 H01L23/48;H01L21/60;H01L23/12 主分类号 H01L23/48
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