发明名称 |
SIMULTANEOUS WAFER BONDING AND INTERCONNECT JOINING |
摘要 |
PURPOSE: A method for simultaneously bonding and mutually connecting wafers is provided to minimize signal propagation delay by maintaining low impedance and a short distance. CONSTITUTION: A second element(200) comprises a main surface, a bond pad, and a dielectric layer(220). A thermal expansion coefficient of the second element is below 10 ppm/°C. The second element includes a plurality of active circuit elements. A first metal layer is arranged on the dielectric layer and the bond pad of a microelectronic element. A second metal layer(230) is arranged on the dielectric layer and the bond pad of the second element. |
申请公布号 |
KR20120069515(A) |
申请公布日期 |
2012.06.28 |
申请号 |
KR20110061826 |
申请日期 |
2011.06.24 |
申请人 |
TESSERA INC. |
发明人 |
OGANESIAN VAGE;HABA BELGACEM;MOHAMMED ILYAS;SAVALIA PIYUSH;MITCHELL CRAIG |
分类号 |
H01L23/48;H01L21/60;H01L23/12 |
主分类号 |
H01L23/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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