发明名称 METHOD OF CORRECTING DEFECT OF GRAYTONE MASK, METHOD OF MANUFACTURING GRAYTONE MASK AND GRAYTONE MASK, AND PATTERN TRANSFER METHOD
摘要 The invention provides a gray level mask defection correcting method, that is a gray level mask defection correcting method for a semi-translucent section (23) having a shading section (21), a translucent section (22) and reducing translucent amount of exposal light to specified amount. The semi-translucent section (23) formed by semi-translucent film (26), and has a working procedure for determining the defection parts (51), (52) when generating defection in the semi-translucent section (23); a working procedure all semi-translucent film (26) of the semi-translucent section including the defections (51), (52), that is an area surrounded by at least on of the shading section and the translucent section; and a working procedure forming semi-translucent correcting film (27) different from raw material or composition of the semi-translucent film (26) at the semi-translucent film (26) removed area (53).
申请公布号 KR101145564(B1) 申请公布日期 2012.06.28
申请号 KR20080063953 申请日期 2008.07.02
申请人 发明人
分类号 G03F1/32;G02F1/1335;G03F1/28;G03F1/54;G03F1/72;G03F1/74;G03F7/20;H01L21/027 主分类号 G03F1/32
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