发明名称 |
FAULT TOLERANT SCANNABLE GLITCH LATCH |
摘要 |
A fault tolerant scannable glitch latch for use with scan chains that enable reset, debug and repairability of machines and parts is described. A scan shift enable signal controls a switch such that a stuck-at zero fault on a data input line is prevented from driving voltage to a state node or pulling the state node high during a scan chain operation. Propagation of the stuck-at zero fault is therefore eliminated. The scan shift enable signal also controls a switch that enables a parallel path to ground for the scan data and state node which would otherwise have been driven high due to the stuck-at zero fault.
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申请公布号 |
US2012166899(A1) |
申请公布日期 |
2012.06.28 |
申请号 |
US20100976170 |
申请日期 |
2010.12.22 |
申请人 |
GILLESPIE KEVIN M.;SIEGEL JOSEPH R.;ELVEY DWIGHT K.;FAIR HARRY R.;ADVANCED MICRO DEVICES, INC. |
发明人 |
GILLESPIE KEVIN M.;SIEGEL JOSEPH R.;ELVEY DWIGHT K.;FAIR HARRY R. |
分类号 |
G06F11/00 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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