发明名称 SECONDARY-ELECTRON DETECTOR AND CHARGED PARTICLE BEAM APPARATUS
摘要 A scintillator 21 is disposed on an incidence side 23a of a photomultiplier 23. A scintillator cap 22 for introducing electrons into the scintillator 21 is disposed around the scintillator 21. The photomultiplier 23 is disposed in a sample chamber 17 with a vacuum seal formed around the photomultiplier 23. An insulating member 25 made of an opaque material is disposed between the scintillator cap 22 and the photomultiplier 23. The insulating member 25 provides insulation between the scintillator cap 22 and the photomultiplier 23. The lateral circumference of the photomultiplier 23 is covered to prevent light from entering the photomultiplier 23. A band filter 27 for blocking the illumination light of an optical microscope 30 is disposed between the scintillator 21 and the incidence side 23a of the photomultiplier 23 to make it possible to conduct simultaneous observations by using the electrons and the optical microscope.
申请公布号 US2012161000(A1) 申请公布日期 2012.06.28
申请号 US201113336946 申请日期 2011.12.23
申请人 TATENO HIROSHI 发明人 TATENO HIROSHI
分类号 H01J37/244;H01J37/26 主分类号 H01J37/244
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