发明名称 METHOD FOR FABRICATING TRANSISTOR
摘要 Abstract of DisclosureMETHOD FOR FABRICATING TRANSISTORA method for fabricating a transistor utilizes gate shadow effect. A gate electrode is provided on a main surface of a semiconductorsubstrate. A drain-forming region on one side of the gate electrode is masked with a first photoresist pattern. A first lightly doped drain (LDD) implant is performed with a tilt angle to dope a source-forming region on the other side of the gate electrode, thereby forming a first LDD region therein. The first photoresist pattern is then stripped. Thesource-forming region is masked with a second photoresist pattern. A second LDD implant is performed with the tilt angle to dope the drain-forming region, thereby forming a second LDD region therein.Figure 2
申请公布号 SG181189(A1) 申请公布日期 2012.06.28
申请号 SG20100086072 申请日期 2010.11.23
申请人 UNITED MICROELECTRONICS CORP. 发明人 WANG, QIN
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