发明名称 OXIDE FOR SEMICONDUCTOR LAYER OF THIN FILM TRANSISTOR AND SPUTTERING TARGET, AND THIN FILM TRANSISTOR
摘要 <P>PROBLEM TO BE SOLVED: To provide an oxide for the semiconductor layer of a thin film transistor which ensures excellent switching characteristics and stress tolerance of a thin film transistor when an oxide semiconductor is used in the semiconductor layer of a thin film transistor. <P>SOLUTION: The oxide for the semiconductor layer of a thin film transistor is used in the semiconductor layer of a thin film transistor. The oxide contains at least one kind of element selected from a group consisting of In, Ga, and Zn, and at least one kind of element selected from a group X consisting of Al, Si, Ni, Ge, Sn, Hf, Ta, and W. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012124446(A) 申请公布日期 2012.06.28
申请号 JP20110008322 申请日期 2011.01.18
申请人 KOBE STEEL LTD 发明人 MORITA SHINYA;KUGIMIYA TOSHIHIRO;MAEDA TAKEAKI;YASUNO SATOSHI;TERAO YASUAKI;MIKI AYA
分类号 H01L29/786;C01B33/12;C01G15/00;C01G17/00;C01G19/00;C01G27/00;C01G35/00;C01G39/00;C01G41/00;C01G53/00;C23C14/08;C23C14/34;C23C16/42;H01L21/336;H01L21/363 主分类号 H01L29/786
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