发明名称 ELECTROSTATIC CHUCKING METHOD OF INSULATING SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To provide an electrostatic chucking method capable of heating in short time and electrostatically chucking an insulating substrate such as a glass substrate in plasma. <P>SOLUTION: In a plasma processing apparatus with an electrostatic chucking mechanism, an insulating substrate is mounted on the electrostatic chucking mechanism and plasma is formed in a space facing the insulating substrate by applying high-frequency power. The plasma makes it possible to rapidly heating only the substrate to be processed without unnecessarily heating the electrostatic chucking mechanism, thus electrostatically chucking the insulating substrate in short time. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012124362(A) 申请公布日期 2012.06.28
申请号 JP20100274500 申请日期 2010.12.09
申请人 CANON ANELVA CORP 发明人 SAITO TAKAYUKI
分类号 H01L21/683 主分类号 H01L21/683
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